断口定量分析中高度参数的扫描电镜测定

Measurement of Height Parameters by Scanning Electron Microscope in Quantitative Fractography

在断口定量分析中根据双目成象原理,运用扫描电镜技术,实现对断口上高度参数的测量,将扫描电镜中获得的立体感觉转变为相应的几何参数,从而可以从断口上获得高度参数的定量数据。同时还分别讨论了进行断口高度参数测量的倾转法和剖面法。

Scanning electron microscopy is applied to measure height parameters of fracture featuresin quantitative fracture analysis by using binocular imaging principle. The stereo vision obtainedby scanning electron microscopy is transformed to geometric parameter, so that tbe height para-meters on fracture surface are obtained. At the same time; the tilt method and profile methodin height parameter measurement of fracture have been discussed separately.