摘要
本实验从仪器变宽角度出发,通过计算机模拟方法观察了不同分辨率条件下谱线之间的干扰情况。这种模拟既有助于样品分析前对仪器分光条件进行合理选择,又可为单色器的性能比较提供有益的参考依据。
The spectral interferences of Fe matrix on Cr Ⅱ 283.563 nm line under various resolutionconditions in ICP-AES were simulated. It has been shown that the simulation is very useful forthe comparison of performance between different ICP spectrometers.
基金
国家自然科学基金