摘要
对严重重叠的光谱干扰校正,采用较小间隔的光谱扫描测量,并用间隔扫描点的数据计算,可减小计算结果的误差,提高结果的准确性。本方法用于校正Nd359.259nm对Sm359.260nm和V328.939nm对Yb328.937nm谱线重叠干扰,得到了满意的结果。
Corrections of severely overlapped spectral interferences in ICP-AES by selfmodeling curve resolution are discussed in the present paper. In resolving highly overlapped lines, intensities are measured with small scan intervals, and the intensities in alternate scan points are used for calculation. This procedure is used to correct spectral interferences of Nd 359.259nm on Sm 359.260nm and V 328.939nm on Yb 328.937nm, and satisfactory results are obtained.
出处
《分析化学》
SCIE
EI
CAS
CSCD
北大核心
1992年第2期180-182,共3页
Chinese Journal of Analytical Chemistry
基金
国家自然科学基金
中科院数理化局的资助
关键词
ICP-AES
干扰校正
曲线分辨
谱线
Inductively coupled plasma, Interference correction, Curve resolution.