摘要
本文研究了粉末直接压片,X射线荧光光谱经验系数法测定土壤中13种痕量元素V、Cr、Ga、Co、Y、Rb、Zn、Cu、Ba、Ni、Zr、Sr、P的方法。对于波长在铁K系吸收限短波侧的分析元素,采用铑靶K_α的compton散射线作内标;对于波长大于铁K系吸收限的分析元素,采用邻近谱峰散射强度作内标。方法简单快速,适合于土壤和地质样品中痕量元素的测定。
Thirteen trace elements V, Cr, Ga, Co, Y, Rb, Zn, Cu, Ba, Ni, Zr, Sr and P have been analysed by XRF using empirical coefficient method. The Rh Compton scattered line isused as an internal standard for elements with wavelengths of spectral lines shorter than that of the K absorption edge of Fe, for other elements the scattered background near the analytical line is used as the internal standard.
出处
《分析试验室》
CAS
CSCD
北大核心
1992年第4期53-56,共4页
Chinese Journal of Analysis Laboratory
关键词
土壤分析
痕量元素
X射线荧光法
X-ray fluorescence spectrometry
soil empirical coefficient method.