摘要
通过测定高强度绝缘子的热膨胀和X射线衍射强度进行试验。使用散点图和多重线性回归分析从统计上对电瓷胎体中石英和方石英的X射线衍射强度与在 6 5 0℃和 2 5 0℃时它们的热膨胀值之间的关系进行了分析。
Tests were carried out by measuring the thermal expansion and the X-ray diffraction intensities of high-tension insulators.The relationship between the X-ray intensity of quartz and cristobalite in electrical porcelain bodies and with their thermal expansion values at 650℃ and 250℃ was examined using scatter diagram and multiple linear regression analysis.A statistical relationship has been found between the thermal expansion and the relative X-ray peakheight intensities of quartz and cristobalite phases in electrical porcelain bodies.
出处
《中国陶瓷》
CAS
CSCD
2002年第5期32-33,58,共3页
China Ceramics