相关性及候选K故障诊断的新方法

Correlativities and New Method for Determination of K Faulty Candidates

本文通过全体支路Ｚ参数矩阵正交投影，研究了诊断子矩阵整体相关结构，给出了用反投影法确定候选ｋ元件故障的新方法，大大减少了计算工作量．

This paper, based on the orthogonal projection of Z-parameter matrix of the total branches, describes the entire structures of the correlativities among diagnostic submatrices and proposes a new method of determining all the candidates for K-faults.