用作模拟可测试性设计的奇佳辨识

Novel Optimum Identification for Analog Design-for-Testability(DfT) Comes from Fast Convergence Identification

奇佳辨识一词始见于北京装甲兵学院 2 0 0 0’测试论文集内 ,后复旦大学中葡固态电路论文集中考虑到模拟可测试性设计必需有关器件精确描述 ,例如双极型器件之三极 :基、集、射应分别有其体积电阻Rb、Rc 和Re,而不应只具基极体积电阻Rb 的通常近似描述 .于是这后两者的器件网络参数Y11-Y33简繁不同 .前者简 ,故有很大部分测试点排列收敛很快 ,呈速敛辨识 .可在短时间内将所有测试点排列全部校验而找到最佳辨识及一些较佳辨识的测试点排列 .将其中少数测试点排列应用到精确描述的器件网络参数上 ,所有排列需优化迭代数千万次才进入饱和状态 .但当审察该些饱和状态时 ,其辨识效果竟依然相对最佳或较佳 ,故名为奇佳辨识 .

The term Novel Optimum Identification (NOI) has been found in a paper from 2000' Test Symposium supported by the Institute of Armoured Divisions.Another paper soon appeared in the Selected Pagers of China-Portugal Workshop on solid-state circuits supported by Fudan University suggesting.DfT for devices inside analog part of Mixed-signal LSI must have their equi.ckt very accurately described.Thus,for example,a bipolar device must has its base,collector and emitter,each with their bulk resistance R b,R c,R e respectively and corresponding device network parameters Y11-Y33 also provided.Of course,the device network parameters will be much simpler if its equi.ckt has R b alone and apparently many test point permutation cases have the desired Fast Convergence Identification (FCI) occurred,so we can check all cases quickly and tabulate the permutation case being optimum and those cases being little or a little less than optimum.While the device equi.ckts has R b,R c and R e both,the device network parameters will be much complicated.Results will converge slowly even thousands of optimization iterations being required before attaining their individual saturated state.Fortunately,the identification effect still shows the optimum and those little or a little less optimum identification fundamentally according to their permutation cases as in R b alone state.Thus we call this optimum identification the NOI.