SAXS测定二氧化硅胶体粒子结构

Determination of Structure of SiO_2 Colloidal Particle by SAXS

本文考察了正硅酸乙酯(TEOS)在碱性催化条件下通过水解和缩聚而制得的二氧化硅胶体的小角X-射线散射(SAXS)特征,通过散射数据对Porod负偏离的分析和校正,测定了胶体粒子的几何结构,包括胶团尺度分布、胶核尺度分布及平均界面层厚度,这有助于认识胶体的物理化学特征。

This short paper investigates the small angle X-ray scattering (SAXS) characteristic of SiO2 colloid prepared by sol-gel process using tetraethoxysilane (TEOS) as precursor and C8H17 (C6H4) (EO) H-n (Tx, n = 4. 5, 6. 5, 10) as surfactant and NH4OH as catalyst. Based on SAXS analysis about the negative deviation from Porod's law and the correction of the deviation, the geometric structure of the colloidal particle including the colloidal core size distribution, the average thickness of the interface layer (shell) between the colloidal core and the dispersed medium and the colloidal particle (core + shell) size distribution are determined. This information is helpful for understanding the physical chemistry property of colloid.