光调制直接重写磁光多层膜测试方法研究

Study on The Testing Method of The Lihgt Intensity Modulated Direct Overwrite for Magneto-optical Multilayered Films

为了测试光调制直接重写磁光多层膜的磁光性能 ,试制了磁光多层膜光调制直接重写特性测试系统。磁光信号检测采用改进差动式检测 ,检测方式仅与磁光克尔角大小有关 ,可以用来作样品的克尔角指示。同时 ,该检测方式由于不受激光功率和盘片反射率变化的影响 ,对光电探测器的温漂特性也有良好抑制作用 ,更适合静态实验的需求 ,可以较好地测试光调制直接重写磁光多层膜的磁光性能。

A testing system for the light intensity modulated direct overwrite magneto optical multilayered films is designed successfully.The differential method developed in the detecting circuit for the magneto optical signal.The method can eliminate the influence of the laser power,the reflectivity and the temperature shift effectly.The detecting precision is improved.This paper presents a theoretical research and experimental investigation of a testing system for the light intensity modulated direct overwriting magneto optical multilayered films.