期刊文献+

陷阱分布对Al_2O_3陶瓷介质在真空中沿面闪络特性的影响 被引量:12

INFLUENCE OF THE TRAP DISTRIBUTION ON SURFACE FLASHOVER PERFORMANCE OF ALUMINA CERAMIC
下载PDF
导出
摘要 真空中绝缘介质的沿面闪络一直是制约真空中电绝缘强度的重要因素。文中采用等温衰减电流法(IDC)研究了在不同烧结温度和掺有不同添加剂情况下氧化铝陶瓷试样的陷阱分布,利用试验装置测量了陶瓷试样的沿面闪络特性。试验结果表明,烧结温度和添加剂显著影响了氧化铝陶瓷的陷阱分布:不同的陷阱分布影响着绝缘介质的沿面闪络特性。根据试验结果,笔者从固体能带理论出发,将陷阱分布和氧化铝陶瓷的沿面闪络特性联系在一起,解释了一些沿面闪络发展过程中的疑难问题。 The overall performance of vacuum insulation is usually limited by the surface flashover phenomena. This paper has investigated the trap distribution of Alumina ceramics samples using IDC (Isothermal Decay Current) method, which was prepared under different sintering temperature and with different additives. The experimental results show that sintering temperature and additives influence trap distribution on Alumina ceramics remarkably. The trap distribution on the ceramics dielectric plays an important role of the surface flashover performance. The trap distribution is related with the surface flashover performance based on the energy band theory in this paper, and it seems successfully to explain the development process of surface flashover phenomena.
出处 《中国电机工程学报》 EI CSCD 北大核心 2003年第2期77-81,共5页 Proceedings of the CSEE
基金 国家自然科学基金项目(50107002) 国家教育部高等学校骨干教师资助项目
关键词 陷阱分布 Al2O3陶瓷介质 真空 沿面闪络特性 绝缘材料 氧化铝陶瓷 等温衰减电流 alumina ceramic trap distribution flashover isothermal decay current additive
  • 相关文献

参考文献7

  • 1[1]Miller H C. Flashover of insulators in vacuum:Review of the phenomena and techniques to improve holdoff voltage[J]. IEEE Trans. on Electr. Insul.,1993, 28(4):512-527.
  • 2[2]Li C R.,Sudarshan T S. Dielectric surface preflashover processes in vacuum [J]. Appl. Phys.,1994,76(6):3313-3320.
  • 3[3]Ding Lijian,Li C R,Wang Jingchun,et al. Micro-discharge and surface flashover of insulators in vacuum [C]. IEEE Annual Report-1999 IEEE Conference on Electrical Insulation and Dielectric Phenomena,1999.
  • 4[4]Simmons J G,Tam M C. Theory of isohtermal currents and the direct determination of trap parameters in distributions[J]. Phys.,Rev. B,1973,7(8):3706-3713.
  • 5丁立健,李成榕,王景春,王伟,程养春.真空中绝缘子沿面预闪络现象的研究[J].中国电机工程学报,2001,21(9):27-32. 被引量:33
  • 6齐建全,桂治轮,陈万平,李龙土.晶界杂质和缺陷行为与BaTiO_3基陶瓷的PTCR效应[J].压电与声光,2000,22(2):114-117. 被引量:5
  • 7[7]Bommakanti R G, Sudarshan T S. Trap-dominated breakdown processes in an insulator bridged vacuum gap [J]. Appl. Phys.,1989,66(5):2091-2099.

二级参考文献4

共引文献36

同被引文献163

引证文献12

二级引证文献143

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部