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A MICROAREA ELECTRON DIFFRACTION ANALYSIS OF 69R AND 147R POLYTYPES OF SiC

A MICROAREA ELECTRON DIFFRACTION ANALYSIS OF 69R AND 147R POLYTYPES OF SiC
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摘要 SiC is known to form many polytypes with different stackings of close-packed layers among which 4H, 15R, 6H and 21R are the polytypes most frequently occurring. Up to the present of the more than one hundred polytypes known many have been found belonging to the [(3, 3)n (3, 2)]8 and [(3, 3)n (3, 4)]8 families. They could be considered as structures derived from the (3, 3) stacking sequence of the 6H poly-
出处 《Chinese Science Bulletin》 SCIE EI CAS 1980年第1期70-74,共5页
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