磁悬浮硬盘转子控制系统中时序电路测试技术

Research on the Test Technology of Sequential Logic Circuits

为提高磁悬浮硬盘转子控制系统的可靠性 ,提出了对时序芯片的测试方法 :手工测试和计算机辅助测试 ;及对时序电路逻辑功能的两种检测技术 :基于状态表的测试技术和自动检测技术 .对于时序芯片 ,手工测试方法效率较低 ,计算机辅助测试方法适用范围更广 ;对于电路逻辑功能 ,基于状态表的测试技术操作相对困难 ,但无须增加额外测试电路 ;自动检测技术操作简单 ,且测试速度快 ,但需要增加辅助检测电路 .

The aim is to improve reliability of the rotors of hard disk drives suspended by magnetic bearings. Test methods of sequential logic chips, manual test and computer aided test are presented. Two test technologies state stable based technology and automatic test technology are given for the test of logic functions of sequential circuit. For sequential chips, manual test is of low efficiency and computer aided test is more practical. For logic functions of sequential circuits, the state table based technology is relatively difficult to be executed, but does not need any extra circuits. The automatic test technology is fast and easy to operate, but needs some extra circuits. Test technology of sequential circuits is very important to guarantee the cooperation of all components of the magnetic bearings of hard disk drives.