摘要
本文从光学薄膜实际结构的理想模型出发,讨论了沿膜厚方向上的非均匀折射率及非均匀色散,提出了非均匀色散的可能模型,设计了非均匀色散的测量方法,并对ZnS薄膜进行了测量。文中给出了ZnS薄膜的测量与计算机计算结果,并对此进行了分析和讨论。
The inhomogeneous index and inhomogeneous disper sion of the optical thin films are discused from the ideal model of the real structure of these, and possible models have been proposed for the inhomogeneous dispersion in this thesis. A method of measuring the inhomogeneous dispersion has been designed. And the measurements have completed for the ZnS thin layers. The results of the measurement and the computation by computer are given for the ZnS thin layers in this thesis.
出处
《激光技术》
CAS
CSCD
1989年第4期37-41,共5页
Laser Technology