摘要
用偏光显微镜解决了X射线技术确定倍频器件取向的困难。把这二种方法结合起来可以圆满地解决定向问题。
The difficulty in the determination of the orientation in frequency doubled devices by X-ray technique has been solved by using the polarization microscope, Thus,the determination of the orientation of sheet crystals can be satisfactorily settled by the combination of these two methods.
出处
《激光技术》
CAS
CSCD
1989年第4期18-20,共3页
Laser Technology