摘要
本文描述了一种简单、可靠而经济的测定碲镉汞晶片x值的方法。文章着重论及其原理及使用。也列出了部分晶片的测定数据,可以看到按照误差估计:△x最大仅小于等于0.03,这种测定确实是一种优于直接密度测试及化学分析的新方法。
A simple, reliable and economical determination method for the x-value of Hg_(1-x)Cd_xTe slices is presented. The paper stresses the discussion of the principle and utilization of this method. The data of the determination for some slices are listed too. It is found that according to the estimation for the error: △x_(max)≤0.03 only. Substantially this determination is a novel way much better than the direct determination by means of the density of sample and chemical analysis.
出处
《激光与红外》
CAS
CSCD
北大核心
1989年第2期40-43,共4页
Laser & Infrared
