摘要
介绍投影光刻机设备的晶片传输系统中切边探测和晶片预对准技术。
Mostly introduction the OF detection and the OF prealignment technology of the Wafer Loader system in the Projection-Lithography equipment.
出处
《电子工业专用设备》
2003年第1期43-47,共5页
Equipment for Electronic Products Manufacturing
关键词
投影光刻
晶片传输
切边
机械预对准
光学预对准
半导体
Projection Lithography
Wafer loader
Orientation flat (OF)
Detection
Machine prealignment Optical prealignment