康普顿背散射成像的蒙特卡罗模拟

The Monte Carlo simulation of Compton backscatter imaging

康普顿背散射成像是利用康普顿效应判断被照射物体内部结构的方法,广泛应用于工业和医学诊断领域。介绍应用MCNP程序模拟康普顿背散射成像的问题,计算了以250keV电子轰击钨靶产生的X射线谱为源的X射线检测碳和铁的康普顿背散射光子角分布,得到这两种物质的不同散射特性。

Compton Backscatter Imaging is a method that uses the principle of Compton Effect to get the image of the scanned object. It's a widely used Nondestructive Testing method in industry and medical diagnosis. A Monte Carlo simulation of Compton backscatter imaging with MCNP is described here.