基于GPIB和单片机的继电器测试系统设计与实现

Design and Implementation of Life Test System for Magnetic Relay Based on GPIB and Microcontroller

通过一些实际分析案例,研究总结了电磁继电器的常见失效模式和机理;针对性地分析部分由于材料理化特性退化导致继电器失效的案例以及与退化相关的特性参数;讨论通过测试关键特性参数来预测潜在退化的可能性。基于GPIB总线和IC单片机控制器,利用计算机系统设计了一套可用于不同应力条件下的继电器关键特性参数测试系统;通过优化软硬件设计,实现了测试过程的自动控制、试验数据实时采集以及智能分析功能,此测试平台为继电器退化趋势分析和寿命预测提供了有力的支撑。

Through some actual failure analysis cases, common failure modes and mechanisms for magnetic relays were studied and concluded. Some cases caused by materiel degradation and related feature parameters were analyzed pertinently. The possibility of predicting the latent degradation through measuring the key feature parameters was discussed. Based on GPIB protocol and microcontroller, a test system for measuring the relay’s key feature parameters under different types of stresses was developed with a computer system. By optimizing the hardware and software design, the testing procedures for automatically controlling, real-time data acquisition and intelligent analysis, were realized. It afforded a test platform to analyze the degradation trend and predict the reliability life of magnetic relays.