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星载计算机抗辐射加固技术 被引量:7

Radiation Hardening Techniques for On-board Computers
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摘要 为掌握星载计算机系统级抗辐射加固技术 ,针对星载计算机的抗辐射薄弱环节 ,研究抗辐射加固措施 ,完成了 386ex三机变结构原理样机。重点研究了抗单粒子效应多机容错技术和存储器校验技术 ,抗总剂量效应屏蔽材料和屏蔽工艺。最后研究了实时多任务操作系统及其抗辐射问题。 The thesis is aimed at to master the system level radiation hardening techniques of OBC. For the weakness of non radiation hardening OBC , we have accomplished the 386 ex prototype of flexible triple modular redundancy architecture. We focuses attention on multi-modular redundancy and error detection and correction of memory chips for SEU protection, RH materials and shielding techniques for total ionizing dose damage. Finally the real-time multitask operating system and software RH technique are studied.
出处 《航天控制》 CSCD 北大核心 2003年第1期10-15,21,共7页 Aerospace Control
关键词 星载计算机 抗辐射加固技术 单粒子效应 总剂量效应 On board computer (OBC) \ Radiation hardening (RH) \ Single event upset (SEU) \ Total ionizing dose
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  • 1[1]C. I. Underwood, J. W. Ward Observation of Single- Event Upsets in Non- Hardened High- Density SRAM in Sun Synchronous Orbit Surrey Satellite Technology. Ltd. 1992
  • 2[2]M. E. Fraeman, J. R. Hayes, D. A. lohr, B. W. Ballard, R. L. Williams and R. M. Henshaw.Experience with Custom Processors in Space Flight Applications. Johns Hopkins University Applied Physics Laboratory Laurel, Maryland 20723 3rd NASA Symposium on VISI Design, 1991
  • 3[3]P. M. O' Neill and G. D. Badhwar. Single Event Upsets for Space Shuttle Flights of New General Purpose Computer Memory Devices. IEEE Transations on Nuclear Science, Vol 41, No 5, October, 1994
  • 4[4]Test Report for Single Event Effects ofthe 80386DX Microprocessor (JPL), NASA- CR- 194509

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