模拟电路中非零交叉情况下故障最小范围的确定方法

Method for Determining the Minimum Existent Range of Fault Elements for Non-null Intersection in Analog Circuits

为确定模拟电路非零交叉情况下故障元件存在范围,提出了一种K故障下诊断的新方法。它是一种确定故障元件存在的最小范围的方法,即在十分现实的K故障下,确定能代表电路所有元件并给出在K故障假设下的最优可测试元件组,使故障定位工作只局限于该组元件。通过可测试值计算和规范式不确定性组与最优可测试成分组的确定,可以诊断故障元件的范围。

A method for determining the minimum existent range of fault elements for nonnull intersection in analog circuit is presented. By assuming the quite realistic Kfault hypothesis, an optimum set of testable elements that represent all the circuit elements is determined. Therefore the work for the fault location can only operate in the elements of this group. So the method constitutes the first step in the development of whatever procedure for the fault location of analog linear circuits. 