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锆石Hf同位素组成的LAM-MC-ICPMS精确测定 被引量:34

Precise analysis of zircon Hf isotopes by LAM MC ICPMS
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摘要 在配备了NewWaveMerchantekLUV213型紫外激光探针进样系统的Isoprobe型MC-ICPMS上进行了溶液和锆石单矿物的Hf同位素比值测定,并对176Yb和176Lu对176Hf的同质异位素干扰校正进行了试验。结果表明,由于自然界Lu的丰度远远小于Yb,所以176Hf的同质异位素干扰主要来自176Yb。当Yb/Hf较低时,可以通过同质异位素干扰校正直接准确测定出176Hf/177Hf比值;当Yb/Hf比值较高时,则需要进行同质异位素干扰校正和外部校正来获得准确的176Hf/177Hf比值。因此,用LAM-MC-ICPMS可以准确、快速地测定锆石的Hf同位素组成。 Hf isotopes are determined for both standard solutions and single zircon crystals using Micromass ISOPROBE MC ICPMS coupled with New Wave Merchantek LUV213 laser ablation microprobe system. Experiments are carried out for proper correction of isobaric interference of 176Yb and 176Lu with 176Hf. The 176Yb is considered as the main isobaric interference with 176Hf, because Lu abundance is very low relative to Yb in natural samples. The 176Hf/177Hf ratio can be precisely determined by internal correction of isobaric interference for sampleswith very low Yb/Hf ratios, whereas internal and external corrections are needed for the samples with relatively high Yb/Hf ratios. The LAM MC ICPMS is therefore capable of analyzing zircon Hf isotopic compositions quickly and precisely.
出处 《地球化学》 CAS CSCD 北大核心 2003年第1期86-90,共5页 Geochimica
基金 中国科学院知识创新工程重要方向性项目(KZCX2-102)
关键词 锗石 铪同位素 激光原位分析 LAM-MC-ICPMS 离子探针 同质异位素 LAM MC ICPMS Hf isotopes zircon in situ analysis by laser ablation
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参考文献17

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