X射线衍射谱的一种分峰新技术

A new kind of technology for the peak separation of X-ray diffraction profiles

采用一种新创立的优化Voigt函数,准确地确定出边带的位置;进一步针对400℃,1080min的CuTi合金衍射谱,在引进两卫星峰相对强度的基础上,由Daniel-Lipson波长公式所计算的调幅组织波长与通过应变衬度条纹测量的波长间的相对误差仅仅是1.35%。这一结果充分地表明Daniel-Lipson波长公式可适用于调幅分解与调幅组织长大的全过程。

The sidebands′ position is accurately determined by a newly optimized voigt function in present investigation.Furthermore,for CuTi alloy aged at 400℃ for 1080 min,after introducing the weight factor of the above two satellites′ intensity,the relative error between the modulating wavelength calculated by DanielLipson′s formula and that measured through strain contrast stripe is less than 1.35%,which fully shows that the DanielLipson′s wavelength formula is applicable to the whole process of the spinodal decomposition and the growth of modulated structure.