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一等环规测量仪的研制 被引量:1

Development of Grade 1 Ring Gauge Measuring Instrument
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摘要 一等环规测量仪是将激光干涉仪测长技术、静态光电显微镜瞄准技术和精密微位移定位技术 作为主体测量技术,以上三项技术的有机结合使该仪器的测量不确定度达到了国际法制计量组织 (OIML)规定的一等环规的测量要求。 The grade 1 ring gauge measuring instrument is such a measuring technology taking the laser interferometer, static state photoelectric microscope and precision micro-displacement measuring device as the main technologies. The organic combination of the above three technologies makes the uncertainty of this instrument meet the measuring requirements of the grade 1 ring gauge regulated by the OIML.
出处 《航空计测技术》 2003年第2期14-15,27,共3页 Aviation Metrology & Measurement Technology
关键词 一等环规测量仪 测量不确定度 光电显微镜瞄准技术 激光干涉仪测长技术 精密微位移定位技术 grade 1 ring gauge: laser interferometer static state photoelectric microscope precision micro-displacement.
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