从定期检验缺陷统计看微机保护的检验

Protection test based on periodic test defect statistics

对保护设备进行定期检验是发现和处理设备缺陷的重要手段。以某变电管理所6年的微机成套保护定期检验为例,统计了微机保护的缺陷,分析了其发生的特点和性质,即主要发生在配套装置和回路中,基建遗留缺陷占很大比例,电磁器件和机械器件的缺陷是设备运行中发生缺陷的主因。将微机保护缺陷分为显性缺陷和隐性缺陷,强调对微机保护的日常状态监视和状态判断,阐明新设备投产前,对其进行全面和严格验收的必要性;对微机保护定期检验,提出了强化首次全面检验、缺陷多发部位重点检验、简化常规检验的内容和做法,以及有条件延长检验周期等措施,以提高保护检验工作效率,收到良好的效果。

The periodic test of the microprocessor-based protection is an important method to find and treat its defects.Based on the6-year periodic tests of a substation,a statistical survey is made for analyzing the characteristics and patterns of the defects.It shows that most defects occur in the necessary accessories and the loops of microprocessor-based protection,a large proportion of which is of the defects happened during the capital construction.The defects of electromagnetic and mechanical components are the main reasons.The defects are classified into the covered defects and revealed defects.Both the daily state monitoring and diagnosis and the overall and sufficient acceptance test of a new device are emphasized.A periodic test scheme is proposed:strengthen the acceptance test,emphasize the check of most defective parts,simplify the normal test,conditionally prolong the test period and so on to improve the efficiency and effect.