摘要
根据晶界的电阻率大于晶界两侧晶粒的电阻率 ,提出晶界对传输信号影响的电容模型。通过不同温度退火 ,得到含晶界数不同的铜导线 ,将含不同晶界数的铜导线制备成标准的高保真同轴电缆 ,并测量其电容值以及损耗正切值。测量结果表明 :导线的电容值以及正切损耗值随晶界数的增加而降低 ,其数值关系满足关系式。垂直于信号传输方向的晶界对传输信号的影响显著 ,而平行于传输信号的晶界对信号的影响相对弱一些。由于晶界的电容效应 ,晶界增加传输信号的失真度 。
Based on the results that the resistivity of grain boundary is greater than that of internal crystals,the present paper brought forward the concept of attached capacitance in copper wires containing grain boundaries Through annealing at different temperatures,the copper wires containing various number of grain boundaries can be obtained The attached capacitance of the copper wires has been measured and the results show that with the number of grain boundaries increasing,the attached capacitance of the copper wires decreases,and the relationship between the number of grain boundaries and the attached capacitance of copper wires can be expressed as y=-3320-2 3x The effect of grain boundaries that are perpendicular to the direction of signal transmission on transmission signal is more evident than that of grain boundaries parallel to the direction Because the grain boundaries in copper wires can be equivalent to capacitances,it is found that with the number of grain boundaries in copper wires increasing,the fuzzy degree of transmission signal increases,and the energy attenuation of transmission signal grows,too
出处
《兵器材料科学与工程》
CAS
CSCD
2003年第2期30-35,共6页
Ordnance Material Science and Engineering
基金
国家科学自然基金 (5 99710 3 3 )
