扩展X射线吸收精细结构谱仪的探测系统

A detection system for extended X-ray absorption fine structure spectrometer

本文详细描述了一个扩展X射线吸收精细结构(EXAFS)谱仪探测系统。用能量约为10keV的X射线测量了该探测系统的坪特性、吸收曲线和线性。并在此EXAFS谱仪上测量了镍样品K吸收边附近的振荡现象,它比前探测器用正比计数管、后探测器用NaI(TI)闪烁计数器测量的结果更精确。

A detection system for the extended X-ray absorption fine structure (EXAFS) spectrometer is described in detail. The plateau characteristic, absorption curves and linearity of the system are measured using X-rays with energy about 10keV. An oscillation phenomenon near K-shell absorption edge of nickel sample is observed by this detection system. The results are more accurate than those obtained by a detection system which consists of a proportional counter as the front detector and a NaI(Tl) scintillation counter as the rear detector.