石英晶体光轴方向厚度的光学测量研究

Optical measurement of the thickness alo ng the quartz crystal axis

给出了一种精确测量石英晶体光轴方向厚度的光学测量方法 ,其测量精度可以达到 0 .0 0 2mm。

In the paper,an accurate optical method to meausure thickness al ong the quartz optical axis is put forwa rd,with which the measurement accuracy c an get up to 0.002mm.