摘要
提出了一种ADC非线性误差测试方法。首先采用正弦波概率密度直方图的积分值求解微分非线性(DNL)和积分非线性(INL),然后采用正弦波码字预测的方法检测ADC偶然转换错误,避免该错误引起的DNL、INL误测。与常规的正弦波直方图法相比,该测试方法无需估算正弦波的幅度和偏置,降低了算法引入的DNL、INL测量误差,解决了正弦波直方图法不能检测ADC偶然转换错误的问题。测试结果证明了该测试方法的可行性。
A nonlinearity testing method of ADC was presented.The DNL and INL were calculated by integral values of sine probability density histogram,then a code predicting method was used to measure the accidentally converting errors of the ADC,which could avoid misdetection of DNL and INL that were caused by the errors.Compared with the conventional sine histogram method,equations for the proposed method were deduced without estimating the amplitude and offset of sine wave,therefore the measuring errors of DNL and INL caused by the calculating procedure were reduced.Furthermore,the problem that the histogram method could not detect the accidentally converting errors of ADC was solved by the proposed method.Test results verified the feasibility of the proposed method.
作者
彭伟
张俊
程杰
刘若琛
PENG Wei;ZHANG Jun;CHENG Jie;LIU Ruochen(The 24th Research Institute of China Electronics Technology Group Corporation,Chongqing400060,P.R.China)
出处
《微电子学》
CAS
北大核心
2019年第3期441-446,共6页
Microelectronics