结构光三维视觉检测中光条椭圆拟合方法与仿真研究

An Elliptical Fitting Method of Light Stripe and Its Simulation for Structured Light Based 3D Vision Inspection

针对在圆柱类工件的结构光三维视觉检测中 ,结构光光条短 ,数据量少 ,造成结构光光条椭圆拟合精度低的问题 ,提出了一种新的基于短轴长度约束的最小二乘拟合方法 ,建立了数学模型 ,进行了仿真研究 ,并与无约束最小二乘拟合方法 (简称无约束法 )进行了比较。仿真结果表明 ,该方法在一定条件下能够有效提高在短弧和噪声情况下光条椭圆拟合的精度和鲁棒性 ,有实际应用的价值。

During inspecting cylindrical workpieces, the structured-light stripe is much short, and contains inadequate data information. Under the circumstance, the fitting precision is usually lower if the inadequate data is fitted by an ellipse. To address this problem, a new least-square fitting method based on the restriction of the length of the elliptical short axis is proposed. Its simulation is finished, and also compared with the non-restriction-method. The simulation results show that the proposed method can efficiently improve the precision and robustness of elliptical fitting for structured light based 3D vision inspection, and will have a bright future for practical application.