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内嵌设备模型的离子注入工艺模拟程序

A Simulation Program with Equipment Model in Ion Implantation Process
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摘要 以离子注入工艺为例 ,通过研究沟道效应对离子注入工艺的影响 ,提出了建立设备模型的必要性 ,并且编程加以实现 . Taking the process of ion implantation as an example,the necessity of establishing an equipment model in process simulation is put forward.A program is made to realize the intention.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2003年第5期556-560,共5页 半导体学报(英文版)
关键词 设备模型 离子注入 工艺模拟 沟道效应 编程 equipment model process simulation ion implantation channeling effects
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参考文献6

  • 1[1]Takeda T,Tazawa S,Yoshii A.Precise ion-implantation analysis including channeling effects.IEEE Trans Electron Devices,1986,ED-33:1278
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  • 3[3]Yang S H,Morris S J,Tian S,et al.Monte Carlo simulation of arsenic ion implantation in (100) single-crystal silicon.IEEE Trans Semiconduct,Manufact,1996,9:49
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