用半导体激光器超高速电光采样技术测量微波信号

ELECTRO-OPTIC SAMPLING MEASUREMENT OF MICROWAVE SIGNALS USING A SEMICONDUCTOR LASER

利用半导体激光器作为采样光源的超高速电光采样测试系统(时间分辨率最高可达16.7ps,电压灵敏度为0.26mVHz^(-1/2)).测量了1～5GHz的微波信号和同轴电缆传输线的色散展宽.

By using the ultrafast electro-optic sampling system with temporal resolution as high as 16.7 ps and voltage sensitivity of 0.26 mVHz^(-1/2), in which a semiconductor laser of 1.3 μm wavelength is used as a source of sampling, the microwave signals of 1～5 GHz and the dispersive characteristics of the coaxial cable have been measured.