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红外焦平面阵列基于黑体的非均匀性校正方法中的限制因素 被引量：11

Limitations of Blackbody-Based Nonuniformity Correction for IRFPA
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摘要 以基本的红外辐射理论为依据 ,阐述了红外焦平面阵列非均匀性校正的物理原理 ,首次综合性地论述了标定类方法所存在的三个基本限制因素 ,并重点给出了红外焦平面阵列响应漂移的实验结果。 The physical theory of nonuniformity correction for infrared focal plane array, and summerized three basic limitations to black based nonuniformity correction for the first time. was described the experimental results of response drift of IRFPA were analyzed and verified emphatically.
作者 刘会通 易新建 刘靖 徐隆
机构地区 华中科技大学光电子工程系 华中科技大学图像识别与人工智能研究所
出处 《红外技术》 CSCD 北大核心 2003年第3期41-44,共4页 Infrared Technology
基金 华中科技大学博士后科研专项基金资助项目代号AA182 0 0 7
关键词 红外焦平面阵列 非均匀性校正 响应漂移 黑体 限制因素 infrared focal plane array (IRFPA), nonuniformity correction (NUC), response drift
分类号 TN215 [电子电信—物理电子学]
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参考文献10

  • 1刘会通,王骐,郑志伟,张明.红外焦平面阵列非线性响应的分析和计算[J].红外与毫米波学报,2001,20(4):253-258. 被引量：20
  • 2Mooney J M, Shepherd F D, Ewing W S, et al. Responsivity. Nonuniformity Limited Performance of Infrared Starting Cameras[J]. Optical Engineering. 1989.28(11): 1151-1161.
  • 3Nelson M D, Johnson J F, Lomheim T S. General Noise Processes in Hybrid Infrared Focal Plane Arrays[J]. Optical Engineering. 1991.30(11): 1682-1700.
  • 4Poropat G V. Nonlinear Compensation for Responsivity Nonuniformities in Cadmium Mercury Telluride Focal Plane Detector Arrays for Use in the 8 to 12(m Spectral Region[J]. Optical Engineering. 1989.28(8) : 887-896.
  • 5Dantes D, Renard C. Influence of Spectral Response Dispersion on the Performances of Infrared Imaging Systems[A]. SPIE(C]. 1998. 3377:97-103.
  • 6Bluzer N. Sensitivity Limitations on IRFPAs Imposed by Detector Nonuniformities[A].SPIE[C]. 1988. 930: 64-75.
  • 7ONeill III J J, Costanzo C,Kaplan D. Characterization of Post Correction Uniformity on Infrared Focal Plane Arrays[A]. SPIE[C]. 1995.2474:208-216.
  • 8Scribner D A, Kruer M R, Gfidley J C,et al. Physical Limitation to Nonuniformity Correction in IR Focal Plane Arrays[A]. SPIE[C]. 1987.865: 185-202.
  • 9Scribner D A, Sarkady K A, Kruer M R,Gfidley C J. Test and Evaluation of Stability in IR Staring Focal Plane Arrays after Nonuniformity Correction[A]. SPIE[C]. 1989. 1108: 255-264.
  • 10Scribner D A, Kruer M R, Gridley C J, Sarkady K. Measurement, Characterization, and Modeling of Noise in Stating Infrared Focal Plane Arrays[A]. SPIE[C]. 1987. 782: 147-160.

二级参考文献15

  • 1[1]Kruer M R,Scribner D A,Killiany J M. Infrared focal plane array technology for navy applications.Optical Engineering,1987,26(3): 182-190
  • 2[2]Naveh O.Sensitivity of scanning and staring infrared seekers for air-to-air missiles.SPIE,1997,3061: 692-711
  • 3[3]Scribner D A, Kruer M R, Gridley J C, et al. Physical limitation to nonuniformity correction in IR focal plane arrays.SPIE,1987,865: 185-202
  • 4[4]Mooney J M, Shepherd F D, Ewing W S, et al. Responsivity nonuniformity limited performance of infrared staring cameras.Optical Engineering,1989,28(11): 1151-1161
  • 5[5]Scribner D A, Caulfield J T, Sakady K A. An imaging metric for infrared focal plane arrays.SPIE,1992,1686: 136-144
  • 6[6]Poropat G V. Nonlinear compensation for responsivity nonuniformities in cadmium mercury telluride focalplane detector arrays for use in the 8 to 12μm spectral region.Optical Engineering,1989,28(8): 887-896
  • 7[7]Karins J P. Models of nonlinearities in focal plane arrays.SPIE,1685: 103-109
  • 8[8]Milton A F, Barone F R, Kruer M R. Influence of nonuniformity on infrared focal plane array performance.Optical Engineering,1985,24(5): 855-862
  • 9[9]Kozlowski L J, Bailey R B. High-performance 5μm 640×480 HgCdTe-on sapphire focal plane arrays.Optical Engineering,1994,33(1): 54-63
  • 10[10]Dereniak E L, Crowe D G. Optical Radiation Detectors. New York:John Wiley & Sons,1984,9-12,36-43,63-82

共引文献19

同被引文献55

引证文献11

二级引证文献58

红外技术
2003年 第3期

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