测试产生方法的新进展

New Developments of Test Pattern Generation

本文综述近几年来国际上在测试产生方法的研究方面的新进展。最近一个明显的趋势就是要使测试产生方法适用于5000门以上的大型电路。在原有算法基础上,进行改进、扩展,使之达到这一要求,已有若干进展。另一方面,新的探索也在进行,以期用新的思想来处理大型电路测试产生的问题。所以,沉静了一段时间的测试产生方法的研究近几年来又重新活跃起来。本文试图揭示这方面的新进展。

This paper summarizes some new developments in the area of test pattern generation during the past years. Extensive work has been done on test pattern generation. An evident trend is to adopt methods for test pattern generation applicable to large circuits with about 5000 gates for engineering applications. Based on the well-known algorithms, such as D-ALG, PODEM, FAN, some improvements and extensions have been made to meet the requirement. On the other hand, however, some new approaches are proposed to introduce new ideas to deal with large circuits. Therefore, it appears that the research on test generation has become active again after a short period of time This paper attemps to reveal some new developments of test pattern generation.