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Optimization of Pulse Laser Annealing to Increase Sharpness of Implanted-junction Rectifier in Semiconductor Heterostructure

Optimization of Pulse Laser Annealing to Increase Sharpness of Implanted-junction Rectifier in Semiconductor Heterostructure
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摘要 It has been recently shown that inhomogeneity of a semiconductor heterostructure leads to increasing of sharpness of diffusion-junction and implanted-junction rectifiers,which are formed in the semiconductor heterostructure.It has been also shown that together with increasing of the sharpness,homogeneity of impurity distribution in doped area increases.The both effect could be increased by formation of an inhomogeneous distribution of temperature(for example,by laser annealing).Some conditions on correlation between inhomogeneities of the semiconductor heterostructure and temperature distribution have been considered.Annealing time has been optimized for pulse laser annealing. It has been recently shown that inhomogeneity of a semiconductor heterostructure leads to increasing of sharpness of diffusion-junction and implanted-junction rectifiers,which are formed in the semiconductor heterostructure.It has been also shown that together with increasing of the sharpness,homogeneity of impurity distribution in doped area increases.The both effect could be increased by formation of an inhomogeneous distribution of temperature(for example,by laser annealing).Some conditions on correlation between inhomogeneities of the semiconductor heterostructure and temperature distribution have been considered.Annealing time has been optimized for pulse laser annealing.
作者 E.L.Pankratov
出处 《Nano-Micro Letters》 SCIE EI CAS 2010年第4期256-267,共12页 纳微快报(英文版)
基金 supported by grant of President of Russia (project № MK-548.2010.2)
关键词 Pulse laser Implanted-juction rectifier HETEROSTRUCTURE Pulse laser Implanted-juction rectifier Heterostructure
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