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Fabrication and Optical Properties of Silicon Nanowires Arrays by Electroless Ag-catalyzed Etching 被引量:4

Fabrication and Optical Properties of Silicon Nanowires Arrays by Electroless Ag-catalyzed Etching
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摘要 In order to realize ultralow surface reflectance and broadband antireflection effects which common pyramidal textures and antireflection coatings can't achieve in photovoltaic industry,we used low-cost and easy-made Ag-catalyzed etching techniques to synthesize silicon nanowires(Si NWs) arrays on the substrate of single-crystalline silicon.The dense vertically-aligned Si NWs arrays are fabricated by local oxidation and selective dissolution of Si in etching solution containing Ag catalyst.The Si NWs arrays with 3 μm in depth make reflectance reduce to less than 3% in the range of 400 to 1000 nm while reflectance gradually reached the optimum value with the increasing of etching time.The antireflection of Si NWs arrays are based on indexgraded mechanism:Si NWs arrays on a subwavelength scale strongly scatter incident light and have graded refractive index that enhance the incidence of light in usable wavelength range.However,surface recombination of Si NWs arrays are deteriorated due to numerous dangling bonds and residual Ag particles. In order to realize ultralow surface reflectance and broadband antireflection effects which common pyramidal textures and antireflection coatings cant achieve in photovoltaic industry, we used low-cost and easy-made Ag-catalyzed etching techniques to synthesize silicon nanowires (SiNWs) arrays on the substrate of single-crystalline silicon. The dense vertically-aligned Si NWs arrays are fabricated by local oxidation and selective dissolution of Si in etching solution containing Ag catalyst. The Si NWs arrays with 3 mu m in depth make reflectance reduce to less than 3% in the range of 400 to 1000 nm while reflectance gradually reached the optimum value with the increasing of etching time. The antireflection of Si NWs arrays are based on index- graded mechanism: Si NWs arrays on a subwavelength scale strongly scatter incident light and have graded refractive index that enhance the incidence of light in usable wavelength range. However, surface recombination of Si NWs arrays are deteriorated due to numerous dangling bonds and residual Ag particles.
出处 《Nano-Micro Letters》 SCIE EI CAS 2011年第2期129-134,共6页 纳微快报(英文版)
基金 partly supported by Natural Science Foundation of China (No.60876045) Shanghai Leading Basic Research Pro ject (No.09JC1405900) Shanghai Leading Academic Discipline Pro ject (No.S30105) R&D Foundation of SHU-SOENs PV Joint Lab (No.SS-E0700601) supported by Analysis and Testing Center of Shanghai University
关键词 Si nanowires Ag-catalyzed etching Broadband antireflection Surface recombination Si nanowires Ag-catalyzed etching Broadband antireflection Surface recombination
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