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Ordered SrTiO_3 Nanoripples Induced by Focused Ion Beam

Ordered SrTiO_3 Nanoripples Induced by Focused Ion Beam
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摘要 Ordered nanoripples on the niobium-doped SrTiO_3 surfaces were fabricated through focused ion beam bombardment. The surface morphology of the SrTiO_3 nanoripples was characterized using in situ focused ion beam/scanning electron microscopy. The well-aligned SrTiO_3 nanostructures were obtained under optimized ion irradiation conditions. The characteristic wavelength was measured as about 210 nm for different ion beam currents. The relationship between the ion irradiation time and current and SrTiO_3 surface morphology was analyzed. The presented method will be an effective supplement for fabrication of SrTiO_3 nanostructures that can be used for ferroelectric and electronic applications. Ordered nanoripples on the niobium-doped SrTiO3 surfaces were fabricated through focused ion beam bombardment. The surface morphology of the SrTiO3 nanoripples was characterized using in situ focused ion beam/scanning electron microscopy. The well-aligned SrTiO3 nanostructures were obtained under optimized ion irradiation conditions. The characteristic wavelength was measured as about 210 nm for different ion beam currents. The relationship between the ion irradiation time and current and SrTiO3 surface morphology was analyzed. The presented method will be an effective supplement for fabrication of SrTiO3 nanostructures that can be used for ferroelectric and electronic applications.
出处 《Nano-Micro Letters》 SCIE EI CAS 2012年第4期243-246,共4页 纳微快报(英文版)
基金 the financial support from the Arkansas Institute for Nanoscience and Engineering at University of Arkansas the International Centre of Artificial Materials(iCAM)at University of Electronic Science and Technology of China
关键词 SRTIO3 focused ion beam nanoripple SELF-ASSEMBLY SrTiO3 focused ion beam nanoripple self-assembly
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