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Measurement of the Waveguide Near-field Optical Spot

Measurement of the Waveguide Near-field Optical Spot
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摘要 The characteristic of near-field spots is analyzed.The size of the near field and the heat response time of the hybrid record medium to overcome super paramagnetic effect are calculated based on the heat transfer theory. A novel measuring method for the diameter of near-field recording spot is also presented. Since the grain of the recording media is tiny enough,near-field optical lithography can be accomplished with the aid of atomic force microscope (AFM).The diameter of near-field recording spot can be obtained by specifically designed computer.So the relationship between the near-field recording spot diameter and the probe size of near-field recording system, the near field recording distance coupling between head and disc can be got. The characteristic of near―field spots is analyzed. The size of the nearfield and the heat response time of the hybrid record medium to overcome super paramagnetic effectare calculated based on the heat transfer theory. A novel measuring method for the diameter ofnear―field recording spot is also presented. Since the grain of the recording media is tiny enough,near ― field optical lithography can be accomplished with the aid of atomic force microscope(AFM). The diameter of near ― field recording spot can be obtained by specifically designedcomputer. So the relationship between the near ― field recording spot diameter and the probe sizeof near―field recording system, the near field recording distance coupling between head and disccan be got.
出处 《Semiconductor Photonics and Technology》 CAS 2003年第2期123-127,共5页 半导体光子学与技术(英文版)
基金 NationalNaturalScienceFoundationofChina ( 60 2 730 77and 697730 74 ) NationalResearchFoundationforFundamentalKeyProjects"973"ofChina(G19990 330 )
关键词 evanescent energy AFM near―field recording spot near―field opticallithography 易消失能量 波导 近场光点 平版印刷术 原子力显微镜
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参考文献7

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