迈克耳孙干涉仪实验中等倾与等厚干涉条纹的判别

How to Distinguish Equal Inclination and Equal Thickness Interferences in Michelson Interferometer Experiment

仔细研究了迈克耳孙干涉仪实验中产生等倾干涉和等厚干涉的实验条件和它们所产生的条纹的区别,提出了判别迈克耳孙干涉实验中等倾与等厚干涉条纹的依据,从而帮助学生加深对这两种干涉条纹的理解和判别,特别是在反射镜M_1与M_2不严格垂直时,同样可以观察到类似于等倾干涉的准圆环状条纹,我们对这一现象进行了分析和解释,并首次推导出等厚干涉直条纹任意一点上的微商(δ/d=2)为常数的结论,这一结果可以作为对迈克耳孙干涉仪现象的一个补充。

In this paper we carefully analyze the experimental conditions of equal inclination and equal thickness interferences in Michelson interferometer experiment and their differences between those two interferences. Accordingly, a judgment of the different interferences from different fringes has been presented. This will help the students easily distinguish the origin of the fringes with different shape, particularly when mirror Ml is not completely perpendicular to mirror M2 and similar circular fringe can be seen as well as equal inclination interference. In this paper Such a phenomenon will be explicated, and it is demonstrated for the first time that the differential quotient at any point of straight streak of equal thickness interferences keeps constant, which can be a complement to phenomenon in Michelson interferometer.