摘要
Ag-MgF2 cermet films with different Ag fractions were prepared by vacuum evaporation. The micfostruc-ture of the films was examined by Raman scattering technique. The surface-enhanced Raman spectrum for MgF2 molecules in the cermet film strongly suggests the existence of Ag nanoparticles dispersed in MgFa matrix. The intensities of the Raman spectra of Ag-MgF2 cermet films increase with Ag fraction. The enhancement of Raman scattering disappears when Ag content reaches wt.20%. The analyses with the transmission electron microscopy showed that Ag-MgF2 cermet films are mainly composed of amorphous MgF2 matrix with embedded faced-center-cubic Ag nanoparticles. It suggests that the percolation threshold should be around wt.20% of Ag content.
Ag-MgF2 cermet films with different Ag fractions were prepared by vacuum evaporation. The micfostruc-ture of the films was examined by Raman scattering technique. The surface-enhanced Raman spectrum for MgF2 molecules in the cermet film strongly suggests the existence of Ag nanoparticles dispersed in MgFa matrix. The intensities of the Raman spectra of Ag-MgF2 cermet films increase with Ag fraction. The enhancement of Raman scattering disappears when Ag content reaches wt.20%. The analyses with the transmission electron microscopy showed that Ag-MgF2 cermet films are mainly composed of amorphous MgF2 matrix with embedded faced-center-cubic Ag nanoparticles. It suggests that the percolation threshold should be around wt.20% of Ag content.
基金
This work was supported by the National Natural Science Foundation of China under Grant No. 59972001 and the Natural Science Foundation of Anhui Province under Grant No. 01044901.
