期刊文献+

实现工艺映射的新方法

A New Method for Technology Mapping
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摘要  逻辑综合中,工艺映射是关键的一步。过去,基于树的映射由于其速度快、算法简洁而被广泛使用。但是,将电路结构划分为树,破坏了电路结构,缩小了映射的解空间。双态覆盖(BinateCovering)能充分利用门级网表的结构特性,使工艺映射后的电路具有更好的性能。 Technology mapping is an important step in logic synthesis In the past, treebased mapping was widely used because of its high speed and conciseness However, the circuit structure is destroyed in this method and better implementations are neglected With binate covering, the structural characteristics of the gatelevel netlist can be explored in detail, and the circuit after technology mapping has better performance
出处 《微电子学》 CAS CSCD 北大核心 2003年第1期9-11,共3页 Microelectronics
基金 美国国家科学基金资助项目(5978EastAsiaandPacificProgram-9602485) 国家"九五"微电子重点科技攻关项目(96-738-01-09-02)
关键词 工艺映射 双态覆盖 逻辑综合 电路结构 Technology mapping Binate covering Logic synthesis
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参考文献7

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