摘要
提出了一种含缓冲层的沟槽绝缘栅双极晶体管(TIGBT)的瞬态解析模型。该模型不仅考虑到TIGBT的高掺杂缓冲层处于小注入状态,分析了缓冲层对TIGBT关断特性的影响,而且还考虑了槽底电子积累层引起的基区电导调制作用的影响。通过与数值模拟结果的比较,表明该模型能准确地描述TIGBT瞬态时的物理特性。
A transient analytical model for Trench Insulated Gate Bipolar Transistors (TIGBT) is presented in this paper This model takes into account not only the turnoff characteristics influenced by heavilydoped buffer layer working in lowlevel injection condition, but also the onstate characteristics influenced by trench gate that modulates the conduction of base A comparison with numerical simulation shows this analytical model is valid for circuit simulation
出处
《微电子学》
CAS
CSCD
北大核心
2003年第1期41-45,共5页
Microelectronics
基金
清华大学信息学院基础创新研究基金(ME9905)