摘要
借助于李代数和辛映射推导出厚透镜成象系统的 Seidel 三级象差系数的解析公式。我们证明了这是普遍的表示式,通过选择合适的几何参数可用于分析薄透镜、凹面(或凸面)-平面透镜、球透镜等常用光学成象系统的象差。
The seidel third-order aberration coefficients of a thick lens imaging system are derived analytically with the aid of Lie algebra and optical symplectic map.We have shown that the expressions obtained in this paper are general and applicable to analyzing aberrations of the conventional optical imaging systems such as thin lens,concave(or convex)-planar lens and spherical lens etc.By a suitable choice of geometrical parameters.
出处
《激光技术》
CAS
CSCD
1992年第3期146-150,共5页
Laser Technology