用于控制NRE和产品测试成本的改进的设计-生产-测试的流程

Improved Design-to-Production-Test Flows Required for Controlling NRE and Production Test Costs

介绍传统测试流程和先进测试流程的比较,新测试流程利用在设计中使用虚拟测试工具、专门的工程测试系统以及灵活的自动测试系统来降低SoC芯片的测试成本。

Introducing a comparison between canventional test flow and advan ced test flow,new test flow with Virtual Tester,special Engineering Test System and flexible ATE Lowered the test cost of SoC.