基于边界扫描技术的板级BIT设计及测试策略

Design Method of PCB Built-in Test and Testing Strategy Based on Boundary Scan Technology

随着超大规模集成电路 (VLSI)、表面安装器件 (SMD)、多层印制电路板 (MPCB)等技术的发展 ,常规BIT设计面临挑战。为解决上述问题 ,本文提出了一种基于边界扫描技术的板级BIT的扫描器件置入法及其测试策略。该方法操作简单 ,经济实用 ,一旦广泛使用 ,无疑将会有很好的军事经济效益。

With the development of VLSI , SMD and MPCB technology, the routine design method of BIT confront with the challenge. In order to solve this problem, the paper presents a posting boundary-scan parts method of PCB built-in test and testing strategy based on boundary scan technology. This method is operated simply has a practical application with a low cost, it will bring out great military and economy benefit in common use no doubt.