面向高频度故障的测试流程优化

The Test Flowchart Optimization Oriented to Frequently Occurring Faults

我们研制的AXE-10程控交换机用户电路板的测试仪,用于对故障用户电路板的修理。对于现有的测试流程进行改进,可进一步提高测试仪的测试效率。然而,要全面地进行优化,需花费很大的工作量。为此,我们面向高频度故障,提出了一个基于原测试流程的局部优化方法,并且还提出了一个以减少诊断所需探针操作次数为目标的启发式故障诊断算法。

In order to repair faulty line interface boards in SPC switching system AXE-10, we developed a tester to locate the faults on boards. The efficiency of the tester can be improved by the optimization of its original test flowchart. However, an overall optimization takes a lot of time and needs great efforts. In this paper, a local-optimization method oriented to frequently occurring faults is presented. A heuristic fault diagnosis algorithm with fewer probing operations is also discussed.