有关ASL-1000测试运放V_(IO)的补充方案

A Complement Method of Testing the V_(IO) of OP AMP for the ASL -1000

在运算放大器输入失调电压(V_(10))的测试中,传统测试设备采用“被测器件-辅助运放”的模式,籍以构成稳定的负反馈网络,从而使DUT的输出电压嵌位于预置电压,而ASL-1000通过独创的电位平衡电路和相位补偿电路同样实现了DUT的输出嵌位,完成了由间接测试向直接测试的转化。针对V_(10)已经失效的芯片,提出了利用ASL-1000现有的硬件资源,在软件上加严判据的失效筛选方法,作为Credence方案的补充。

In the test of the input offset voltage ( V10) of OP AMP, traditional test equipments take the test mode of ' DUT - auxiliary OP AMP ' which makes a stable negative feedback network, so that the output voltage of the DUT will be clamped at the provision voltage . While the ASL - 1000 which has uniquely developed the 'equilibrium potential circuit' and the 'phase compensating circuit' can also complete it. Thus it realizes the conversion from indirect test to direct test. Concerning to the chip which has failed in V10 , the article raises a method that makes harsh condition on the software depending on the current hardware. And this method will be a useful supplement for the Credence project.