期刊文献+

PIEZOSPECTROSCOPIC STUDY OF RESIDUAL STRESSES AROUND INDENTATIONS IN SiC/Al_O_3 NANOCOMPOSITE

SiC/Al_2O_3纳米复合材料压痕周围残余应力的压谱特性研究(英文)
下载PDF
导出
摘要 A new experimental measurement of residual stresses around Vickers′ indentations on the surface of the SiC/Al 2O 3 nanocomposites is proposed with the aid of a Raman microprobe. Results s how that the shifts of R lines in the fluorescence spectra va ry with the distance from the centre of indentation. The magnitude of load appli ed on the surface of the materials through the indenter influences the shifts of R lines to great extent. The luminescence of R lines of the materials before indenting is used to determine the residual stresses around the indentation in the materials, assuming that the stress tensor is transversely isotropic. Final ly, the term of hydrostatic stress is adopted to explain and compare different residual stresses around indentations with the increase of the indenting load an d the distance from the centre of indentations. < 提出了用拉曼显微镜测试 Si C/ Al2 O3纳米复合材料表层 V氏压痕周围残余应力的新方法。试验结果表明 ,其荧光光谱 R曲线峰频率随离压痕中心的距离大小而变化 ,压头施加在材料上的载荷的大小 ,严重影响 R曲线频率的变化。文中假定应力张量横向各向同性 ,并以加压之前材料的荧光光谱作为基值 ,确定压痕周围的残余应力。最后 ,采用等静应力解释并比较了压痕周围残余应力与压痕载荷、离压痕中心距离之间的关系。
出处 《Transactions of Nanjing University of Aeronautics and Astronautics》 EI 2003年第1期85-90,共6页 南京航空航天大学学报(英文版)
关键词 residual stress NANOCOMPOSITE piezospec troscopi c method INDENTATION SiC/Al 2O 3 SiC/A12O3纳米复合材料 压痕载荷 碳化硅 氧化铝 荧光光谱 残余应力 压谱方法
  • 相关文献

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部