期刊文献+

超高级别微电子洁净厂房的测试

Testing high class clean rooms in a microelectronic factory
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摘要 指出超高级别微电子洁净厂房环境参数对产品质量至关重要。介绍了与超高级别微电子洁净厂房有关的分级标准 ,并对某 0 .1 μm 1级洁净厂房作了实际测试 ,给出测试项目、测试方法和使用的主要测试仪器。 Points out that the environment parameters of high class clean rooms in a microelectronic factory directly affect the product quality. Presents a current standard for high-class microelectronic clean rooms. Tests a high class building of class 1 with grade 0.1 μm. Summarizes the required testing items, procedures and apparatus in such a factory.
机构地区 天津大学
出处 《暖通空调》 北大核心 2003年第3期97-98,共2页 Heating Ventilating & Air Conditioning
关键词 洁净室 微电子厂房 测试 产品质量 集成电路 clean room, microelectronic factory, testing
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参考文献4

  • 1.GB 50073—2001.洁净厂房设计规范[S].,..
  • 2US federal standard 209E. Airborne particulate cleanliness classes in cleanrooms and clean zones. US General Service Administration, 1992.
  • 3ISO 14644-1, 2. Cleanrooms and associated controlled environments, Part 1: Classification of air cleanliness, Part 2:Specifications for testing and monitoring to prove continued compliance with ISO 14644 - 1. International Organization for Standardization, 1999.
  • 4SEMI F21 - 95. Classification of airborne molecular contaminant levels in clean environments. Semiconductor Equipment and Materials International, 1995.

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