期刊文献+

基于可测性分析的容差网络故障定位的神经网络实现 被引量:1

A Neural Network Approach to Fault Location of Tolerance Network Based on Testability Analysis
下载PDF
导出
摘要 利用BP网络的分类功能 ,提出一种有容差模拟电路的故障诊断方法 ,此方法基于可测性理论及模糊组概念 ,所用训练样本少 。 Using the category function of BP networks, a method for fault location of analog circuit with tolerance is presented, which is based on testability theory and ambiguity group concept. In the proposed method, only a small number of samples are needed to train the BPNN, and this method is robust.
出处 《电子测量与仪器学报》 CSCD 2003年第2期65-69,共5页 Journal of Electronic Measurement and Instrumentation
关键词 模拟电路 故障诊断 可测性 神经网络 BP网络 容差 Analog circuit, fault diagnosis, testability, neural network.
  • 相关文献

参考文献8

  • 1孙增圻.智能控制理论与技术[M].北京,广西:清华大学出版社,广西科学技术出版社,2000..
  • 2崔莼,罗先觉,邱关源.故障诊断交流字典法的前向神经网络实现方法[J].微电子学,1996,26(5):313-318. 被引量:14
  • 3R. Spina, S. Upadhyaya, Linear Circuit Fauh Diagnosis Using Neuromorphic Analyzers, IEEE Trans. CAS-I, Vol. 44,No.3, March 1997.
  • 4N. Sen, R. saeks, A measure of Testability and its Application to Test point Selection- Theory, Proc. 20th Midwest symp. On CAS, Lubbock, TX, Aug. 1977.
  • 5R. S. Berkowitz, Conditions for Network- Element- Value Solvability, IRE Trans. On Circuit Theory, Vol. CT- 9,March 1962.
  • 6A. Liberatore, S. Manetti and M. C. Piccirilli, A New Efficient Method for Analog Circuit Testability Measurement,IEEE Trans. Instrum. Meas. Tech.. conf. , IMTC'94, Hamamatsu, Japan, May 1994.
  • 7C. Fedi, S. Manetti, M. Piccirilli and J. Starzyk, Determination of an Optimum Set of Testable Components in the Fault Diagnosis of Analog Linear Circuit, IEEE Trans. CAS- I, Vol. 46, No.7, July 1999.
  • 8R. Decarlo, L. Rapisarda and M. Wicks, Analog Multifrequence Fault Diagnosis with the Assumption of Limited Failures,in Testing and Diagnosis of Analog Circuit and Systems, R. - W. Liu, Ed New York:Van Nostrand Reinhold, 1991, ch. 5.

共引文献47

同被引文献22

引证文献1

二级引证文献38

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部