摘要
利用晶体双折射和由散射偏振引起的光学干涉技术 ,设计出一种高精度光学位移传感器 该传感器采用同轴光学系统 ,测量精度约为 4 μm ,测量范围不小于 2 8mm ,且测量时不需要使用相干光源 ,故结构紧凑。
Based on birefringent interference high precision displacement sensor is designed. A laser beam emitting from a build-in LD in the sensor points to the detected surface, and the dispersed light goes through the optical lenses and a birefringent crystal. The ordinary ray and extraordinary ray from the crystal interfere at a detector. As the distance from the sensor to a target changes, the interference fringes shift. By detecting movement of the fringes, the displacement can be calculated. Precision of the sensor can achieve micron.
出处
《光子学报》
EI
CAS
CSCD
北大核心
2003年第7期840-843,共4页
Acta Photonica Sinica
关键词
双折射
偏振
干涉
位移传感器
Birefringence
Polarization
Interference
Displacement sensor